第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
分類(lèi)
QT-8100 Digital-Analog Hybrid IC Test System (Cable-Mount)
Suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc.
|
Suspended power supply |
Multiple sites in parallel |
Multi-channel high precision |
Supports multiple extensions |
| Model | QT-8100 |
| Product Advantages |
The digital-analog hybrid IC test system is suitable for conventional DC and AC parameter testing and functional testing of hybrid and analog IC devices. Main test subjects include: power management, digital consumer, motor drive, audio amplifier, operational amplifier, etc. |
| Key Features |
? Float V/I source with 4 quadrants ? Full resource extracted from the test box,support more than 8site test ? Digital speed 51.2MHz, vector depth 64M ? True parallel test, multiple 1000V/20A high voltage and high current ? 18 bit high precision sampling ? Multi-channel analog capability, supports up to 400 VI channels,Multi-channel digital capability, supports a maximum of 256VI channels ? Multi-channel high precision time measurement unit, supporting ns level time measurement ? Support RF module expansion ? Efficient communication configuration for more efficient testing |
Recommend推薦產(chǎn)品
|
中國(guó)廣東省佛山市南海國(guó)家高新區(qū)新光源產(chǎn)業(yè)基地光明大道16號(hào) |
|
0757 83207313 (銷(xiāo)售) |
|
0757 83208786 (銷(xiāo)售) |
|
info@powertechsemi.com |
佛山市聯(lián)動(dòng)科技股份有限公司 版權(quán)所有 powertechsemi.com ? 2015 | 隱私政策 | Sitemap 粵ICP備17127080號(hào)-1
