第三代
半導(dǎo)體測試家族
Third generation semiconductor testing family
分類
QT-8600RF Mixed Signal RF Test System
RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test
|
Suspended power supply |
Multiple sites in parallel |
Multi-channel high precision |
Supports multiple extensions |
| Model | QT-8600RF Mixed Signal RF Test System |
| Product Advantages | RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test |
| Key Features |
? DC, digital, RF integrated machine ? 16 RF ports (8 in & 8 out) ? 6Ghz RF measurement circuit, power can be configured to 48dBm ? Self-developed RF source board and algorithm, UPH improves by more than 90% compared with traditional ones ? Supports vector and scalar testing ? Digital meets MIPI 50Mhz or above test ? Supports 2-station RF parallel testing and multi-station composite testing ? Provide a cost-effective test platform for RF switches, LNA, TUNER, filters and other devices. |
Recommend推薦產(chǎn)品
|
中國廣東省佛山市南海國家高新區(qū)新光源產(chǎn)業(yè)基地光明大道16號 |
|
0757 83207313 (銷售) |
|
0757 83208786 (銷售) |
|
info@powertechsemi.com |
佛山市聯(lián)動科技股份有限公司 版權(quán)所有 powertechsemi.com ? 2015 | 隱私政策 | Sitemap 粵ICP備17127080號-1
