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        QT-8400 power device multi-site test system
        Explore the infinite possibilities of third-generation transistors

        test host

        GaN Test Kit

        Power Device Test Kit

        QT-8400 is composed of test host and test station Test Kit,
        There are two types of Test Kit: Power Device Test Kit & GaN Test Kit.

        Test Kit
        Can be selected according to needs
        • Power Device Test Kit

          Power Device Test Kit for CP testing needs such as MOSFET/SIC, diodes, transistors, etc.

        • GaN Test Kit

          GaN Test Kit for Gallium Nitride testing needs.

        105cm
        Standing keyboard height
        75cm
        Sitting keyboard height
        Sign design
        Stand & sit
        quick switch
        Heart-touching
        user experience

        Based on the ergonomic design, the 8400 main case is designed for different environments such as design companies, laboratories, and packaging and testing factories to meet the user's keyboard operation needs in different standing and sitting postures. We have designed a unique guide line. , allowing users to quickly find the recommended keyboard height when standing or sitting, and can also fine-tune it according to personal height differences, which greatly improves operating comfort and efficiency.

        * Patent applied

        Sign design
        Stand & sit
        quick switch
        Heart-touching
        User experience

        Based on the ergonomic design, the 8400 main case is designed for different environments such as design companies, laboratories, and packaging and testing factories to meet the user's keyboard operation needs in different standing and sitting postures. We have designed a unique guide line. , allowing users to quickly find the recommended keyboard height when standing or sitting, and can also fine-tune it according to personal height differences, which greatly improves operating comfort and efficiency.

        * Patent applied

        105cm
        Standing keyboard height
        75cm
        Sitting keyboard height
        Parallel testing
        doubles efficiency
        Supports 2/4/8/16 Site parallel testing to meet customer needs for higher testing efficiency.
        Testing needs,
        comprehensive coverage
        QT-8400 platform provides 20A/100A, 1KV/2KV multi-site test solutions, support extended high voltage/DC modules, up to 8KV, 2000A, support extended avalanche, RGCG, dynamic RDson and other dynamic parameter test modules, to meet the third generation of semiconductor testing needs

        QT-8400 GaN

        QT-8400 D

        Test Range

        Dedicated to testing dynamic and static electrical parameters of gallium nitride

        Test Range

        Dedicated to MOSFET/SIC, diodes, transistors, IGBT and other CP testing.

        Parameter index

        Floating V/I Source
        Voltage 1KV/2KV
        20A/100A;

        Parameter index

        Floating V/I Source
        Voltage 1KV/2KV/3KV
        20A/100A/200A

        Number of parallel tests

        2/4/8/16 Site

        Number of parallel tests

        2/4/8/16 Site

        Extensible dynamic modules

        LCR test module (CG)
        Dynamic RDSON module (supports hard and soft cutting)

        Extensible dynamic modules

        Avalanche test module (UIS, EAS)
        LCR test module (RG, CG)

        Expandable high voltage/DC module

        Expandable up to 8KV, 2KA

        Expandable high voltage/DC module

        Expandable up to 8KV, 2KA

        Precise measurement

        The GaN Test Kit has a built-in precision measurement circuit to achieve accurate measurements at the nA level and mΩ level.

        Precise measurement

        The Power Device Test Kit has a built-in precision measurement circuit to achieve nA-level and mΩ-level accurate measurements.

        Flexible allocation
        of board resources
        Our equipment adopts a pluggable board architecture, allowing you to flexibly match boards according to your needs, thereby achieving precise control of testing costs.
        Comprehensive functions to
        meet various needs
        The test host boards are all four-quadrant V/I sources, equipped with AWG and oscilloscope, and have comprehensive functions to meet various scanning test needs such as I-V curves.

        Built-in oscilloscope graph

        AWG Editor
        PTS OS is intuitive and easy to use,
        Designed for testing & production
        We have fully optimized the QT-8400 PTS OS software interface to improve practicality, aesthetics and ease of use. Greatly improve the efficiency of test development, production and debugging and calibration, making it easy for users to operate efficiently.

        * Patent applied

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