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        第三代
        半導體測試家族
        Third generation semiconductor testing family
         
        
        
        首頁 產(chǎn)品中心 Test System Power Device Testing System
        分類
        
    
         
         
     
    
            
    
         
        
        
          
        
           
             
        
                         
               
        
                
                
                
        
        
    
        
      
     
    
    
         
            
            
        
                  
        
                       
                       
          
                          
                                             
                       
     
                          
                          
                       
        
           
                 
        
                 
        
           
                
                   

        
    
        
             
                   
                        
        
                            
        
                                
        
                                    
        
                                    
                                                        
                                                    
                    
                                 
                
                
                
                
                                        
                                                   
                                    
        
                                    
        
                                    
        
                                    
        
                                
        
                            
        
                            
        
                                                        
                            
                            
                            
         
                        
        
             
        
             
        
                    
        
                             
        QT-3102 thermal resistance tester
        
                             
        QT-3102-XX test device type: triode, field effect tube, IGBT, diode
        
                             
         


        

        

        
	
		
        
			
				
        
					 
				
        
				
        
					Support double DIE
				
        
			        		
			
				
        
					 
				
        
				
        
					1000W thermal resistance
				
        
			        		
			
				
        
					 
				
        
				
        
					Overload and undervoltage protection
				
        
			        		
			
				
        
					
        
				
        
				
        
					
        
				
        
			        		
		
        
	        

        
                             
        
                             
        
                                                          
        
                    
        
             
        
    
          
    
        
    

        
	
		
        
			
				Type 
			
			
				QT-3102
			
		
        
		
        
			
				Advantages 
			
			
				QT-3102-XX test device type: triode, field effect tube, IGBT, diode
        
               R26: Can be built into the DC test item of QT-4100 to achieve high-power built-in thermal resistance testing
        
               R26：Dual Die testing can be implemented through scanbox
        
			        		
		
        
		
        
			
				Main Features 
			
			
				? The maximum current and maximum voltage depend on the model. The maximum current is 20A and 50A respectively.
        
                ? The maximum voltages are 100V and 200V respectively
        
			        		
		
        
	        

        

        
                           
        
                           
        
                          
        

   

            
               
  

        Testing standards檢測標準
              
  
                
                
    
        
    
    
    
    
    
    
        
        
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