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        第三代
        半導(dǎo)體測試家族
        Third generation semiconductor testing family
         
        
        
        首頁 產(chǎn)品中心 Test System Power Device Testing System
        分類
        
    
         
         
     
    
            
    
         
        
        
          
        
           
             
        
                         
               
        
                
                
                
        
        
    
        
      
     
    
    
         
            
            
        
                  
        
                       
                       
          
                          
                                             
                       
     
                          
                          
                       
        
           
                 
        
                 
        
           
                
                   

        
    
        
             
                   
                        
        
                            
        
                                
        
                                    
        
                                    
                                                        
                                                    
                    
                                 
                
                
                
                
                                        
                                                   
                                    
        
                                    
        
                                    
        
                                    
        
                                
        
                            
        
                            
        
                                                        
                            
                            
                            
         
                        
        
             
        
             
        
                    
        
                             
        QT-3104 QG gate charge test
        
                             
        QT-3104 QG meets the tiny QG value test of SiC devices.
        
                             
         


        

        

        
	
		
        
			
				
        
					 
				
        
				
        
					Support double DIE
				
        
			        		
			
				
        
					 
				
        
				
        
					Overload and undervoltage protection
				
        
			        		
			
				
        
					 
				
        
				
        
					High precision testing
				
        
			        		
			
				
        
					 
				
        
				
        
					Support extension
				
        
			        		
		
        
	        

        
                             
        
                             
        
                                                          
        
                    
        
             
        
    
          
    
        
    

        
	
		
        
			
				Model 
			
			
				QT-3104 QG
			
		
        
		
        
			
				Product Advantages 
			
			
				Meets the tiny QG value test of SiC devices
			
		
        
		
        
			
				Key Features 
			
			
				? Test capability: 200A/150V 150A/1000V
			
		
        
	        

        

        
                             
        
                             
        
                            
        

   
    
               
  
                
                
    
        
    
    
    
    
    
    
        
        
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