第三代
半導(dǎo)體測(cè)試家族
Third generation semiconductor testing family
分類
QT-DRM101000 GaN Dynamic RDON
Suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution
|
Hard handover <1us |
Supports resistive/ inductive loads |
Support hard/
soft handover |
Multiple-pulse output |
| Type | QT-DRM101000 |
| Advantages |
QT-DRM101000 is suitable for dynamic RDON parameter testing of gallium nitride. Can be combined with QT-4100, QT-8000 to form a test solution |
| Main Features |
? Support FT or CP, laboratory, mass production testing ? Hard handover and soft handover, hard handover can meet the requirement of<1uS measurement RDON ? Output capacity 10A/1000V
|
Recommend推薦產(chǎn)品
|
中國(guó)廣東省佛山市南海國(guó)家高新區(qū)新光源產(chǎn)業(yè)基地光明大道16號(hào) |
|
0757 83207313 (銷售) |
|
0757 83208786 (銷售) |
|
info@powertechsemi.com |
佛山市聯(lián)動(dòng)科技股份有限公司 版權(quán)所有 powertechsemi.com ? 2015 | 隱私政策 | Sitemap 粵ICP備17127080號(hào)-1
