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        第三代
        半導體測試家族
        Third generation semiconductor testing family
         
        
        
        首頁 產(chǎn)品中心 Test System Power Device Testing System
        分類
        
    
         
         
     
    
            
    
         
        
        
          
        
           
             
        
                         
               
        
                
                
                
        
        
    
        
      
     
    
    
         
            
            
        
                  
        
                       
                       
          
                          
                                             
                       
     
                          
                          
                       
        
           
                 
        
                 
        
           
                
                   

        
    
        
             
                   
                        
        
                            
        
                                
        
                                    
        
                                    
                                                        
                                                    
                    
                                 
                
                
                
                
                                        
                                                   
                                    
        
                                    
        
                                    
        
                                    
        
                                
        
                            
        
                            
        
                                                        
                            
                            
                            
         
                        
        
             
        
             
        
                    
        
                             
        KGD (Know Good Die) testing solution
        
                             
        Supports high temperature and normal temperature testing: DC+SW+UIL+DC&RG;
Support testing pin card protection scheme;
Provide a complete set of testing + sorting solutions;
        
                             
         


        

        

        
	
		
        
			
				
        
					  
				
        
				
        
					Pin card 
				
        
				
        
					protection
        
              
				
        
			        		
			
				
        
					    
				
        
				
        
					Two-DUT test in parallel
        
              
				
        
			        		
			
				
        
					  
				
        
				
        
					High temperature and  
				
        
				
        
					normal temperature 
				
        
			        		
			
				
        
					  
				
        
				
        
					Data merge 
				
        
			        		
		
        
	        

        
                             
        
                             
        
                                                          
        
                    
        
             
        
    
          
    
        
    

        
	
		
        
			
				Model 
			
			
				KGD testing solutions
			
		
        
		
        
			
				Product Advantages 
			
			
				? Low spurious solutions;
        
                                                 ? Exclusive pin card protection patented technology;
        
                                                 ? Overload and undervoltage protection;
        
                                                 ? Test two wafers at a time;
        
                                                 ? Supports high temperature heating
        
			        		
		
        
		
        
			
				
        
			        		
			
				
        
			        		
		
        
	        

        

        
                                                                            
        

   
    
               
  
                
                
    
        
    
    
    
    
    
    
        
        
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