第三代
半導體測試家族
Third generation semiconductor testing family
分類
Prober
Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc. Automatic loading and unloading, Wafer ID reading. Fully automatic CCD visual n
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Suspended power supply |
Multiple sites in parallel |
Multi-channel high precision |
Supports multiple extensions |
| Model | Prober |
| Product introduction |
Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc.
Automatic loading and unloading, Wafer ID reading. |
| Features |
? Fully automatic CCD visual needle positioning. ? High-precision positioning platform. ? Support normal high temperature testing. ? Generate Mapping display Bin in real time. ? Universal GPIB, TTL, R-232 interface. |
Recommend推薦產(chǎn)品
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中國廣東省佛山市南海國家高新區(qū)新光源產(chǎn)業(yè)基地光明大道16號 |
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0757 83207313 (銷售) |
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0757 83208786 (銷售) |
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info@powertechsemi.com |
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