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        第三代
        半導(dǎo)體測試家族
        Third generation semiconductor testing family
         
        
        
    
         
         
     
    
            
    
         
        
        
          
        
           
             
        
                         
               
        
                
                
                
        
        
    
        
      
     
    
    
         
            
            
        
                  
        
                       
                       
          
                          
                                             
                       
     
                          
                          
                       
        
           
                 
        
                 
        
           
                
                   

        
    
        
             
                   
                        
        
                            
        
                                
        
                                    
        
                                    
                                                        
                                                    
                    
                                 
                
                
                
                
                                        
                                                   
                                    
        
                                    
        
                                    
        
                                    
        
                                
        
                            
        
                            
        
                                                        
                            
                            
                            
         
                        
        
             
        
             
        
                    
        
                             
        KGD handler
        
                             
        
                             
         


        

        

        
	
		
        
			
				
        
					 
				
        
				
        
					Suspended power supply
				
        
			        		
			
				
        
					 
				
        
				
        
					Multiple sites in parallel
				
        
			        		
			
				
        
					 
				
        
				
        
					Multi-channel high precision
				
        
			        		
			
				
        
					 
				
        
				
        
					Supports multiple extensions
				
        
			        		
		
        
	        

        
                             
        
                             
        
                                                          
        
                    
        
             
        
    
          
    
        
    

        
	
		
        
			
				Model 
			
			
				KGD handler
			
		
        
		
        
			
				Product introduction 
			
			
				Fully automatic testing, supporting SiC wafer, Waffle Pack, Tape&Reel loading and unloading. 
        
			        		
		
        
		
        
			
				Features 
			
			
				? Multi-station parallel testing, different stations support different temperatures and test items. 
        
          ? Static, dynamic, avalanche function testing, and the test sequence is adjustable. 
        
          ? High temperature preheating and chip surface anti-oxidation protection. 
        
          ? High temperature test, temperature range: room temperature~200°C. 
        
          ? The power-on pin card is sealed and supports nitrogen filling to protect against high-pressure sparks and nitrogen pressure monitoring. 
        
			        		
		
        
	        

        

        
                            
        

   
    
               
  
                
                
    
        
    
    
    
    
    
    
        
        
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